International Journal of Current Microbiology and Applied Sciences (IJCMAS)
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Original Research Articles                      Volume : 8, Issue:6, June, 2019

PRINT ISSN : 2319-7692
Online ISSN : 2319-7706
Issues : 12 per year
Publisher : Excellent Publishers
Email : /
Editor-in-chief: Dr.M.Prakash
Index Copernicus ICV 2018: 95.39
NAAS RATING 2020: 5.38

Int.J.Curr.Microbiol.App.Sci.2019.8(6): 1550-1555

Genetic Analysis for Growth and Yield Parameters in Common Bean (Phaseolus vulgaris L.)
K. Gangadhara1*, L.P. Yadav1, Raj Kumar2 V.V. Apparao1 and R. Selvakumar3
1Horticulture-Vegetable Science, ICAR-CIAH, RS-CHES, Vejalpur, Godhra, Gujarat, India
2SMS (Horticulture), KVK, Panchamahal, Gujarat, India
3ICAR-Central Institute of Temperate Horticulture, KD Farm, Old Air Field, Rangreth-190 007, Srinagar, Jammu and Kashmir, India
*Corresponding author

The genetic analysis was carried in a 6x6 half diallel breeding programme of common bean for thirteen yield and yield attributing parameters. Both additive and non-additive genetic components were responsible in the genetic system controlling yield and its component characters. The additive (D) genetic variance was significant for Days to first flowering, Days to fifty per cent flowering, Days to maturity and pod length. Dominant components (H1 and H2) were showed significantly difference for plant height at 30 DAS and 60 DAS, number of branches at 30 and 60 DAS, days to first flowering, days to fifty per cent flowering, days to maturity, pod length, pod weight, number of seeds per plant and hundred seed weight. The high narrow sense heritability was recorded for pod length (0.683) followed by pod weight (0.381) and days to first flowering (0.353). It is evidenced that both additive and non-additive gene effects are involved in the genetic control of the traits. So both gene effects should be considered when developing superior lines.

Keywords: French bean, Additive, Non additive, Narrow sense heritability

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How to cite this article:

Gangadhara, K., L.P. Yadav, Raj Kumar, V.V. Apparao and Selvakumar, R. 2019. Genetic Analysis for Growth and Yield Parameters in Common Bean (Phaseolus vulgaris L.).Int.J.Curr.Microbiol.App.Sci. 8(6): 1550-1555. doi:
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