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National Academy of Agricultural Sciences (NAAS)
NAAS Score: *5.38 (2020)
[Effective from January 1, 2020]
For more details click here
ICV 2022: 95.28
Index Copernicus ICI Journals Master List 2022 - IJCMAS--ICV 2022: 95.28
For more details click here
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Original Research Articles                      Volume : 10, Issue:9, September, 2021
PRINT ISSN : 2319-7692
Online ISSN : 2319-7706
Issues : 12 per year
Publisher : Excellent Publishers
Email : editorijcmas@gmail.com /
submit@ijcmas.com
Editor-in-chief: Dr.M.Prakash
Index Copernicus ICV 2018: 95.39
NAAS RATING 2020: 5.38
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Int.J.Curr.Microbiol.App.Sci.2021.10(9): 538-544
DOI: https://doi.org/10.20546/ijcmas.2021.1009.062


Evaluation of Yield Loss Assessment Caused due to Curvularia Leaf Spot (Curvularia lunata) in Maize
Tarun Kumar Jatwa*, S. S. Sharma, Neeraj K. Meena, Irfan Khan,Roop Singh and Indu
Department of Plant Pathology, Rajasthan Collage of Agriculture, MPUAT, Udaipur, Rajasthan
*Corresponding author
Abstract:

An experiment was conducted during Kahrif 2017 and Kharif 2018 at department of plant pathology, Rajasthan collage of Agriculture, Udaipur, Raj. to find out the average yield loss assessment caused due to Curvularia leaf spot of maize. During Kharif 2017 estimated average yield loss was 21.69% with 18.56 % PDI and 1032.33 kg/plot yield in protected plot similarly in Kharif 2018 yield loss was 22.49% and 992.73 kg /plot yield with 18.07% PDI. On average yield loss caused due to CLS in maize in both years was estimated 22.06%.


Keywords: Yield loss, Curvularia lead spot, Loss assessment

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How to cite this article:

Tarun Kumar Jatwa, S. S. Sharma, Neeraj K. Meena, Irfan Khan, Roop Singh and Indu. 2021. Evaluation of Yield Loss Assessment Caused due to Curvularia Leaf Spot (Curvularia lunata) in Maize.

Int.J.Curr.Microbiol.App.Sci. 10(9): 538-544. doi: https://doi.org/10.20546/ijcmas.2021.1009.062
Copyright: This is an Open Access article distributed under the terms of the Creative Commons Attribution-NonCommercial-ShareAlike license.

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