Wheat rusts (Leaf rust, Stem rust and Stripe rust) continue to pose a serious threat by inflicting losses in different parts of world. Leaf rust caused by Puccinia triticina Eriks. is the most common rust disease of wheat (Triticum aestivum L.) and is widespread in India and posses a major threat to the wheat production of the country. Depending upon the severity and duration of infection, the losses may reach up to 50% of the yield. CIMMYT has developed a series of synthetic hexaploid wheat (SHW) by incorporating D genome donor Triticum tauschii in T. durum cultivars. In the present study one of these SHWs, Synthetic 45 was investigated for effectivity of leaf rust resistance. Characterization of leaf rust resistance in Synthetic 45 by multipathotype testing showed high degree of broad spectrum resistance at seedling stage to diverse 15 pathotypes of leaf rust pathogen in India.

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